
	Tagungen - Tagungsberichte - GDCh - DECHEMA - VDI

Tagungsberichte - Europact 2008 - Programm

3. Jahrestagung - Europact 2008 - 23. - 25. April in Frankfurt am Main - Scientific Programme

Wednesday, April 23, 2008

Room Max-Buchner-Hörsaal
9:00     Plenary Lecture Roger S. Benson, CPACT/UK
            Production 2020 – PACT contribution

9:45     Plenary Lecture Martin Hajduk, Degussa GmbH, Hanau/D
            Modern methods of process analyticals for monitoring and control of chemical plants
10:30 Coffee break

Room:   Carl-Duisberg-Hörsaal
Room:  Max-Buchner-Hörsaal

                Production 2020 with respect to process analysis and control                Monitoring and control of unit operations

Chair:      W.-D. Hergeth, Wacker Chemie AG, Burghausen/D Chair:    M. Maiwald, BAM, Berlin/D

11:00       A miniaturized NIR spectrometer system for process applications
                 W. Becker , FhI für Chemische Technologie, Pfinztal/D; H. Grüger, T. Eggloff, FhI für
                Photonische Mikrosysteme, Dresden/D 11:00    Integrated multivariable monitoring and control
               M. O'Brien , D. Lovett, Perceptive Engineering Ltd., Cheshire/UK

11:30       CEMS in industrial plants - present developments in Europe
                H. Foedisch , S. Schramm, P. Schengber, Dr. Födisch Umweltmesstechnik AG,
                Markranstädt/D 11:30    Application of PAT in bioreaction processes and integrated downstream
               operations
               R. Luttmann, Hamburg University of Applied Sciences/D

12:00       Combination of process analytical technology and process control for optimized
                plant operation
                 A. Schocker , T. Kleinert, BASF Aktiengesellschaft, Ludwigshafen/D 12:00    Feedback linearization control of chemical processes, using adaptive neural
               network, based on semi-mechanistic and black-box modelling
                F. Hourfar , Petropars Ltd./ Petroleum University of Technology, Tehran/IR;
               K. Salahshoor, Petroleum University of Technology, Tehran/IR

12:30       PAT as a platform for the manufacturing industry in SME
                 R.W. Kessler , Reutlingen University/D; W. Kessler, Steinbeis Technology Transfer
                Centre for Process Control and Data Analysis, Reutlingen/D 12:30    Process analytics optimizes plant efficiency for ethylene production - a case
               study using a complete analytical solution package
               H. Mahler, Siemens AG, Karlsruhe/D

13:00-14:00 Lunch break
14:00-15:30 Poster Session I

Room: Max-Buchner-Hörsaal

Process analytics and modelling

Chair: S. Küppers, Forschungszentrum Jülich/D

15:30 Plenary Lecture Wolfgang Marquardt, RWTH Aachen University/D
Indirect hard modeling for spectroscopic calibration - methods and applications

16:15         An end-user's point of view on the development of process analytical technologies
                 Á. Diez-Lázaro , C. Ribes, The Dow Chemical Company, Terneuzen/NL; M. Dittenhafer, The Dow Chemical Company, Midland,
                 MI/USA; J.D. Tate, The Dow Chemical Company, Freeport, TX/USA

16:45 Modeling reaction kinetics by multivariate analysis: combining spectroscopy and calorimetry
M. Krell , J. Piermeier, N.C. Imlinger , Wacker Chemie AG, Burghausen/D

17:15 Informal Mixer
20:00 End of Wednesday

Thursday, April 24, 2008
Room: Max-Buchner-Hörsaal 8:30 Plenary Lecture Ana de Juan , University of Barcelona/E ; Roma Tauler, IIQAB-CSIS, Barcelona/E Multivariate curve resolution for characterization of compounds and pathways in process analysis 9:15 Plenary Lecture Costas Kiparissides, Aristotele University of Thessaloniki/GR Application of multidimensional population balance equations to chemical and biochemical systems: computational methods and experimental validation 10:00 Coffee break
Room: Carl-Duisberg-Hörsaal	Room: Max-Buchner-Hörsaal
Control for profit and safety	Making the most of your data
Chair: J. Morris, University of Newcastle upon Tyne/UK	Chair: R. Tauler, University of Barcelona/E
10:30 Measurability and controllability P. Tummers, DSM Resolve, Geleen/NL	10:30 Practical application of integrated process diagnostics in variability cause analysis A.J. Mason, AJM Consulting Services Ltd., Grimsby/UK
11:00 Qualification of ozone sensors in purified water loops C. Lauer, BIS Prozesstechnik GmbH, Frankfurt am Main/D	11:00 New developments in multivariate calibration P. Teppola , VTT Technical Research Centre of Finland, Kuopio/FIN; R. Marbach, VTT Technical Research Centre of Finland, Oulu/FIN
11:30 Multivariate monitoring and end-point detection of batch processes using FTIR spectroscopy I. Måge , M. Kermit, V. Lengard, CAMO Software AS, Oslo/N	11:30 Multi-way analysis for investigation of commercial pectin Chr.B. Zachariassen , NNE Pharmaplan, Soeborg/DK; J. Larsen, CP Kelco ApS, Lille Skensved/DK; F. van den Berg, R. Bro, University of Copenhagen/DK; A. de Juan, University of Barcelona/E; R. Tauler, IIQAB-CSIC/E
12:00 NeSSI - a platform for water quality sensor arrays D.M. Simko, Swagelok Company, Solon, OH/USA	12:00 Configuration-free analysis of process data F. Alsmeyer, AixCAPE e.V., Aachen/D
12:30 Industrialization trends of tunable diode laser spectroscopy W. Ziegler , S. Bichlmeier, M. Markus, Siemens AG, Karlsruhe/D	12:30 Online-DoE: sustainable development of process knowledge S. Strandt , Evonik Degussa GmbH, Hanau-Wolfgang/D; R. Mühlhaus, Merck KGaA, Darmstadt/D

13:00 Lunch break
14:00-15:30 Poster Session II

Room:      Max-Buchner-Hörsaal
15:30         Plenary Lecture E. Neil Lewis, Malvern Instruments, Columbia, MD/USA
                  The evolution of chemical imaging from a novel technology to a routine laboratory and process analytical tool

Room: Carl-Duisberg-Hörsaal	Room: Max-Buchner-Hörsaal
*New PAT technology*	*Chemical imaging*
Chair: D. Littlejohn, University of Strathclyde, Glasgow/UK	Chair: R.W. Kessler, Reutlingen University/D
16:15 Exact definition of “specificity of response” in the multivariate case - severe consequences for today’s practice of PLS/PCR R. Marbach, VTT Optical Instrument Center, Oulu/FIN; P. Teppola , VTT Technical Research Centre of Finland, Kuopio/FIN	16:15 High speed hyperspectral chemical imaging T. Hyvärinen , E. Herrala, J. Jussila, SPECIM, Spectral Imaging Ltd., Oulu/FIN
16:45 The potential of Laser-Induced Plasma Spectroscopy (LIBS) for elemental process analysis I. Gornushkin, U. Panne , BAM Federal Institute for Materials Research and Testing, Berlin/D	16:45 Mid-Infrared and Near-Infrared imaging spectroscopy with focal plane array detectors: applications in material science and quality control H.W. Siesler, University of Duisburg-Essen/D
17:15 Ultrasonic Resonator Technology - an emerging technique for process control K. Dzyek, S. Schulze, K. Born, D. Gau, R. Parlitz , TF Instruments GmbH, Heidelberg/D	17:15 Optimized chemical imaging and process control - interactive exploratory analysis tools for calibration modeling J. Burger, BurgerMetrics SIA, Jelgava/LV
17:45-18:15 Impedance spectroscopy for the in situ detection of the particle size in process applications S. Doerner , T. Schneider, P.R. Hauptmann, University of Magdeburg/D	17:45-18:15 Online and atline imaging of tablets - trade off between lateral resolution and quantitative limitations K. Rebner , T. Merz, D. Oelkrug, R.W. Kessler, University Reutlingen/D; W. Kessler, Steinbeis Technology Transfer Centre for Process Control and Data Analysis, Reutlingen/D

19:00 Bus transfer to Conference dinner

Dinner Lectures (15 min. each) during the boat trip:
The human factor as chance to optimise processes
S. Festag , Bergische Universität Wuppertal/D; S. Hartwig, Bergische Universität Wuppertal-HF/D

Experience of working as a western PAT-engineer in China
M. Nehring , H. Kaul, V. Huth, BASF Aktiengesellschaft, Ludwigshafen/D

23:00 Estimated return to Frankfurt am Main

Friday, April 25, 2008
Room: Max-Buchner-Hörsaal 8:30 Plenary Lecture Wim Haanstra, Teijin Twaron B.V., Arnhem/NL Process analysis in Twaron manufacturing 9:15 Plenary Lecure Rafique Gani, Technical University of Denmark, Lyngby/DK A model-based framework for design and analysis of PAT systems 10:00 Coffee break with snacks
Room: Carl-Duisberg-Hörsaal	Room: Max-Buchner-Hörsaal
Process Preformance Optimisation	Status and development of PAT
Chair: P. de Bokx, Philips Netherlands BV, Eindhoven/NL	Chair: A. Halstead, PM Project Services Ltd., Hampshire/UK
10:30 Batch process monitoring with Near Infrared Spectroscopy C. Didden , M. Huys, DSM Resolve, Geleen/NL	10:30 Maintenance strategies in PAT and their economical impact M. Riekehof, BASF Aktiengesellschaft, Ludwigshafen/D
11:00 Model-based methodology for robust design and process validation of preparative chromatography M. Degerman , B. Nilsson, Lund University/S	11:00 PAT initiatives extend the range of process MS monitoring of drying processes, from API to finished products and medical devices G. Lewis, AMETEK GmbH, Meerbusch/D
11:30 Determining optimal operating conditions for preparative purifications with varying feed composition M. Onsberg, M. Degerman, B. Nilsson , Lund University/S	11:30 Molecular insights: process control with miniaturised fibre optical ATR-infrared sensors C.B. Minnich , RWTH Aachen University/D; L. Küpper, Infrared fiber sensors, Aachen/D; M. Kaever, RWTH Aachen University/D; W. Hempelmann, MMT Micro Mechatronic Technologies GmbH, Siegen/D; L. Greiner, M.A. Liauw, RWTH Aachen University/D
12:00 Industrial on-line quality control of thin surface layers on metal sheets by spectral interference in combination with multivariate data analysis W. Kessler , Steinbeis Technology Transfer Centre, Reutlingen/D; R.W. Kessler, University Reutlingen/D	12:00 Application of PAT principles from process development to manufac turing T. Hembach , F. Jordt , Siemens AG, Frankfurt am Main/D
12:30 Sampling and online measurement of the water content in hard cheese J.L. Johnsen , M.M. Lokke, Arla Foods, Brabrand/DK	12:30 Case study: applying PAT principles to manufacturing legacy products for the biotech industry M. Rook, Millipore SAS, Molsheim/F

Room     Max-Buchner-Hörsaal
13:00      Closing, Best Poster Prize, Siemens Prize
13:30      End

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